PCE Instruments PCE-COM 20 Conductivity Tester for Metals
Features | PCE-COM 20 Conductivity Tester for Metals
- Eddy current measuring principle
- For non-ferrous metals and alloys
- Non-destructive testing (NDT)
- 60 kHZ operating frequency
- Large measuring range up to 112% IACS or 65 MS/m
- Memory for up to 500 groups of measurements
- Automatic temperature compensation (ATC)
- Lift-off compensation up to 500 μm
- Automatic calibration
- Adjustable backlighting
- Internal rechargeable battery
- Portable, handheld
- User friendly
- Samples of Titanium 1.03% IACS, Bronze 8.11% IACS, and Copper 100% IACS
Description | PCE-COM 20 Conductivity Tester for Metals
PCE-COM 20 is a portable handheld non-destructive material tester for non-ferrous metals. This non-destructive testing (NDT) device uses eddy current to determine the electrical conductivity of non-ferrous metals such as aluminium and copper.
Featuring an operating frequency of 60 kHz, the conductivity meter has a large measuring range of 0.51 … 112% IACS with an accuracy of +/- 0.5% at 20°C / 68°F. Thanks to a resolution of up to 0.01% IACS, automatic temperature compensation (ATC) and lift-off compensation (up to 500 μm), the device ensures quick, easy, accurate and reproducible measurements of coated or corroded pieces during changing ambient conditions.
Measurement of the electrical conductivity of non-ferrous metals, such as aluminium, copper, titanium, magnesium or bronze, is necessary in applications involving electrical conductors and the characterization of alloys. Typical application areas are the assessment of strength differences in heat-treated or hardened materials, the authenticity testing of coin alloys, the verification of alloy inhomogeneities in critical components and the sorting of materials.
The conductivity meter is powered by an internal battery that can be charged via the interface on the bottom of the unit. In addition to the connection for the charging adapter, there is a USB interface allowing for the transfer of measurement data to a PC for more detailed analysis.